WAFER PROFILER CVP21
The Wafer Profiler CVP21 is a handy tool  to measure 
	doping profiles in semiconductor layers
	by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, 
	CV-Profiling) in semiconductor research or production.
	This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop 
	strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of 
	semiconductors.
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		 CVP21 
		with footprint 60(W)*80(D)*195(H)cm,  | 
		
		CVP21 is the COMPLETE SOLUTION:
		CVP21 supports the COMPLETE spectrum of materials: 
 CVP21 supports the COMPLETE sample range: 
 CVP21 supports the COMPLETE resolution range: 
 (*) may depend on material type/ sample quality. Please ask for sample measurements 
 CVP21 comes as a COMPLETE measurement system: 
 
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		 CVP21 
		as a table-top unit  | 
		
	 CVP21 can be delivered: 
 CVP21 installation requirements: 
 
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	The
	
	benefit list compares our equipment CVP21 to other ECV equipment.
	
	
	Patents: 
	DE-10256821, US-7026255 (furthers pending).
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                     Application requirements:  | 
                
                     Our solutions:  | 
            
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                     Production applications  | 
                
                     Easy, clear and automatic operation  | 
            
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                     Research applications  | 
                
                     High flexibility of the configuration recipes  | 
            
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                     Long process times  | 
                
                     Very high reliability  | 
            
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                     Huge data streams  | 
                
                     Clear and reliable data storage and backup  | 
            
Further information: PDF Flyer (230kB)